Optimization of Single layer Antireflection Coating for Infra-Red Spectrum on Silicon Substrate for Solar Cell Applications

Authors

  • Kumar S Dept. of Electrical & Electronics, Kalinga University, Atal Nagar Raipur

Keywords:

AR Coating, Optimum value, Refractive indices, Substrate etc

Abstract

Antireflection (AR) coatings are widely applied on optical devices for not only reducing the undesired reflection loss from the surfaces of the devices, but also for improving the contrast of the image of optical systems. Without the application of AR coatings on optical devices, the partial reflected light from the surfaces results in the formation of ghost images on the image plane, which reduces the contrast of the optical image. In general, the construction parameters of the optimal AR coating design for substrates with different refractive indices are different, thus the substrates should be coated in separate deposition runs. For saving time and reducing cost, this is of practical importance for a commercial thin-film coating shop if different substrates need to be AR-coated. The present work has been carried out to investigate the optimum values of reflectance as a function of wavelength in the infra- red region. The reflectance has been reduced from 32% of silicon surface to less than 1% using ARC film.

References

[1]Kentaroh Watanabe, Akio Higo, Masakazu Sugiyama and Yoshiaki Nakano, ―Self- Assembled Si02 Particle Coating on 2 Layer Anti-Reflection Films For Efficiency Enhancement of GaAs PV Cells‖, ©2010 IEEE.

[2]M. H. Kang, A. Ebong, B. Rounsaville, A. Rohatgi, and J. Hong, ―Silane-free PECV silicon carbon nitride (SiCxNy) passivation and anti-reflection coatings for high efficiency silicon solar cells‖, ©2010 IEEE.

[3]D. A. P. Bulla, B. V. Borgesb, M. A. Romerob, N. I. Morimotoa, L. G. Netob and A.L. Cortes,―Design and Fabrication of SiO&N4 CVD Optical Waveguides‖, SBMODEEE MTT-S IMOC`99 Proceedings ©1999 IEEE.

[4]Y. Wang, R. Tummala, L. Q. GUO, W. Zhou, and M. Ta01, ―Solution-Processed Spherical Surface Textures on Amorphous Silicon Solar Cells‖, ©2009 IEEE.

[5] Halyna Petrovska, Igor Demkovych and Yaroslav Bobitski, ―The Photothermal Method For Testing Of Parameters Of Thin-Film Coatings‖, C4OL 2005, Ukrane, ©2005 IEEE.

[6]A.A. Abouelsaood, M.Y. Ghannam, J. Poortmans, and R.P. Mettens, ―Accurate Modeling Of Light Trapping In Thin Film Silicon Solar Cells‖, 26th PVSC; 1997; Anaheim, CA, ©1997 IEEE.

Downloads

Published

2025-11-25

How to Cite

[1]
S. Kumar, “Optimization of Single layer Antireflection Coating for Infra-Red Spectrum on Silicon Substrate for Solar Cell Applications”, Int. J. Comp. Sci. Eng., vol. 7, no. 11, pp. 5–7, Nov. 2025.

Issue

Vol. 7 No. 11 (2019): IJCSE Special Issue May Edition

Section

Research Article

License

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.

Authors contributing to this journal agree to publish their articles under the Creative Commons Attribution 4.0 International License, allowing third parties to share their work (copy, distribute, transmit) and to adapt it, under the condition that the authors are given credit and that in the event of reuse or distribution, the terms of this license are made clear.