Jaikumar M, Kathiresan V. An Evidential approach on Feature Subset Selection in Software Defect Prediction. Int. J. Comp. Sci. Eng. [Internet]. 2025 Nov. 12 [cited 2026 Feb. 2];5(12):41-9. Available from: https://ijcse.isroset.org/index.php/j/article/view/1764