TANEJA, Divya; SINGH, Rajvir; SINGH, Ajmer. Package Level Test Case Minimization for Bug Prediction using Linear Regression Machine Learning Approach. International Journal of Computer Sciences and Engineering, [S. l.], v. 7, n. 6, p. 364–370, 2019. DOI: 10.26438/ijcse/v7i6.364370. Disponível em: https://ijcse.isroset.org/index.php/j/article/view/6792. Acesso em: 1 feb. 2026.