P, Spoorthi; M, Jayashankara. A Machine Learning Approach to Predict Crop yeild and Reduction of Cost by Finding Best Accuracy. International Journal of Computer Sciences and Engineering, [S. l.], v. 8, n. 3, p. 61–66, 2020. DOI: 10.26438/ijcse/v8i3.6166. Disponível em: https://ijcse.isroset.org/index.php/j/article/view/6001. Acesso em: 2 feb. 2026.