KHAN, Mohammed Naim; ARYA, Namita; SINGH, Amit Prakash. MBT for Functional Testing of Embedded Systems. International Journal of Computer Sciences and Engineering, [S. l.], v. 4, n. 5, p. 10–16, 2025. Disponível em: https://ijcse.isroset.org/index.php/j/article/view/1122. Acesso em: 2 feb. 2026.